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Merck

481769

Gallium nitride

99.9% trace metals basis

Synonym(s):

Gallium mononitride, Gallium mononitride (GaN)

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About This Item

Linear Formula:
GaN
CAS Number:
25617-97-4
Molecular Weight:
83.73
NACRES:
NA.23
PubChem Substance ID:
24871779
UNSPSC Code:
12352300
EC Number:
247-129-0
MDL number:
MFCD00016108

Key Documents

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InChI key

JMASRVWKEDWRBT-UHFFFAOYSA-N

InChI

1S/Ga.N

SMILES string

N#[Ga]

assay

99.9% trace metals basis

form

powder

mp

800 °C (lit.)

Quality Level

100

Related Categories

Application

Gallium nitride (GaN) is a wide band gap semiconducting material, which can be used in the development of a variety of electronic devices, such as light emitting diodes (LEDs), and field effect transistors (FETs). It can also be used as a transition metal dopant for spintronics-based applications.

pictograms

Exclamation mark
GHS07

signalword

Warning

hcodes

H317

Hazard Classifications

Skin Sens. 1

Storage Class

11 - Combustible Solids

wgk

WGK 3

flash_point_f

Not applicable

flash_point_c

Not applicable

ppe

Eyeshields, Faceshields, Gloves, type N95 (US)

Regulatory Listings

Regulatory Listings are mainly provided for chemical products. Only limited information can be provided here for non-chemical products. No entry means none of the components are listed. It is the user’s obligation to ensure the safe and legal use of the product.

481769-10G: + 481769-VAR: + 481769-BULK: + 481769-50G:

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Certificates of Analysis (COA)

Lot/Batch Number
MKCC3784
MKBZ9624V
MKBT0282V
MKBQ9230V
MKBK7514V

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Sanjay Sankaranarayanan et al.
ACS omega, 4(12), 14772-14779 (2019-09-26)
Growth of gallium nitride nanowires on etched sapphire and GaN substrates using binary catalytic alloy were investigated by manipulating the growth time and precursor-to-substrate distance. The variations in behavior at different growth conditions were observed using X-ray diffractometer, Raman spectroscopy
Fabrizio Gaulandris et al.
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 26(1), 3-17 (2020-01-21)
One of the biggest challenges for in situ heating transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) is the ability to measure the local temperature of the specimen accurately. Despite technological improvements in the construction of TEM/STEM heating

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