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About This Item
vapor pressure
7.3 mmHg ( 25 °C)
assay
99.995% trace metals basis
form
crystalline
reaction suitability
core: copper, reagent type: catalyst
impurities
≤0.001% N compounds, ≤0.005% insolubles, <50 ppm total metallic impurities
mp
110 °C (dec.) (lit.)
anion traces
chloride (Cl-): ≤0.001%
cation traces
Ca: ≤0.005%, Fe: ≤0.003%, K: ≤0.01%, Na: ≤0.02%, Ni: ≤0.005%
SMILES string
O.O.O.O.O.[Cu++].[O-]S([O-])(=O)=O
InChI
1S/Cu.H2O4S.5H2O/c;1-5(2,3)4;;;;;/h;(H2,1,2,3,4);5*1H2/q+2;;;;;;/p-2
InChI key
JZCCFEFSEZPSOG-UHFFFAOYSA-L
Application
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signalword
Danger
hcodes
Hazard Classifications
Acute Tox. 4 Oral - Aquatic Acute 1 - Aquatic Chronic 1 - Eye Dam. 1
Storage Class
13 - Non Combustible Solids
wgk
WGK 3
flash_point_f
Not applicable
flash_point_c
Not applicable
ppe
dust mask type N95 (US), Eyeshields, Faceshields, Gloves
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In many technologies, performance requirements drive device dimensions below the scale of electron mean free paths (λe). This trend has increased scientific interest and technological importance of electrical resistivities at the nanoscale.


